波长色散X射线荧光光谱法测定锰硅、锰铁合金中主次量元素

Determination of Primary and Secondary Elements in Manganese Silicon and Ferromanganese Alloys by Wavelength Dispersive X-ray Fluorescence Spectrometry

将试样与氧化剂充分混匀,放置在熔剂铺底的铂金坩埚中,再以少许熔剂覆盖,滴加少量溴化锂作脱模剂,放置于熔融仪中在高温下熔融,铸成玻璃熔片。样品表层经X-射线照射,产生特征X-射线荧光强度,根据特征X射线强度和标准值回归工作曲线,计算出样品中锰、硅和磷的质量分数。经大量试验证明,此方法操作简便,分析周期短,分析结果准确可靠,尤其适宜作为大批量合金检验的方法。

The sample was thoroughly mixed with oxidant,placed in the platinum crucible with flux base,covered with a little flux,dropped with a small amount of lithium bromide as mold release agent,and placed in the melting instrument to melt at high temperature to cast the glass melt sheet.The surface of the sample is irradiated by X-ray,and the characteristic X-ray fluorescence intensity is generated.According to the regression working curve of characteristic X-ray intensity and standard value,the mass fraction of manganese,silicon and phosphorus in the sample is calculated.A large number of tests has been proved that this method is simple in operation,short in analysis period,accurate and reliable in analysis results,and is especially suitable for the testing of large quantities of alloy.