光电耦合器应用失效研究

Research on Application Failure of Optical Coupler

针对光电耦合器在LLC谐振半桥拓扑结构中的应用失效问题,通过参数测试、X射线透视检查、制样镜检、机械开封、电子显微镜观察与能谱分析等手段开展失效分析,确定失效是由于光电耦合器存在批次性的工艺缺陷导致,并提出了相应的缺陷识别及工艺改进方法,为光电耦合器的可靠性增长提供了实践依据。

Aiming at the application failure of optical coupler in LLC resonant half-bridge topology,failure analysis is carried out through parameter testing,X-ray fluoroscopy inspection,microscopic examination,mechanical unpacking,electron microscope observation and energy spectrum analysis,and it is determined that the failure is caused by batch process defects of the optical coupler,and the corresponding defect identification and process improvement methods are proposed,which provides a practical basis for reliability growth of the optical coupler.