环形件周向X光探伤工艺研究

Study on Circumferential X-ray Flaw Detection Technology of Ring Parts

在对环形零件进行射线探伤的质量检验中引入了周向X光探伤,但探伤过程中随着透照区域和射线束夹角的变化,实际透照厚度比K值会发生较大的变化。本文主要阐述了周向X光探伤方法和原理、特点及应用等,通过部分环形零件的实验,摸索环形件周向X光探伤的工艺布置要求、工艺参数及透照底片的质量情况,为周向X光探伤方法在实际检测工作中的全面应用积累必要的数据和参数。

The circumferential X-ray flaw detection is introduced in the quality inspection of ring parts.However,the actual transillumination thickness will change greatly compared to the K value with the change of the transillumination area and the angle of ray beam.This paper mainly describes the method,principle,characteristics and application of the circumferential X-ray flaw detection.Through the experiment of some ring parts,the technical layout requirements,technological parameters and the quality of the transilluminated negative film of the circumferential X-ray flaw detection of ring parts are explored.The necessary data and parameters are accumulated for the comprehensive application of the circumferential X-ray flaw detection method in practical test.