Axios-PW4400型X射线荧光仪的曲线漂移校正方法

Correction method of curve drift for axios-pw4400 X-ray fluorescence spectrometer

本文介绍了Axios-PW4400型X射线荧光仪的曲线漂移校正方法,从监控荧光仪稳定性入手,当仪器状态发生变化时使用标准化样对漂移的荧光强度进行补偿校正,消除仪器状态变化对荧光仪检测结果的影响,并通过检测标样完成对工作曲线准确性的验证。该校正方法代替了用手工滴定进行比对的传统方法,大大提高了工作效率,降低了劳动强度。

This paper introduces the curve drift correction method of axios-pw4400 X-ray fluorescence instrument. Starting from monitoring the stability of the fluorescence instrument, the standard sample is used to compensate and correct the drift fluorescence intensity when the instrument state changes, so as to eliminate the influence of the instrument state change on the detection results of the fluorescence instrument, and the accuracy of the working curve is verified by testing the standard sample. This correction method replaces the traditional method of manual titration, greatly improves the work efficiency and reduces the labor intensity.