笔记本电脑高速存储芯片电磁辐射检测

Electromagnetic Radiation Detection of the Laptop High-speed Memory Chip

本文通过对笔记本电脑高速存储芯片电磁辐射测量方法、表面扫描法的测试原理进行深入研究,对测试数据处理算法、数据呈现方式和数据库模型进行研究,突破传统电磁辐射测量中仅有频谱曲线数据的弊端,实现电磁辐射分布、电磁辐射强度、电磁辐射频谱的多维度可视化呈现及智能化分析。并针对近场探头在不同距离下对高速存储芯片电磁辐射结果影响做具体论述,这对近场辐射的研究十分重要,也进一步推动了新产品研发测试的发展。

This paper thoroughly studied the electromagnetic radiation measurement method and the test principle of surface scanning method,studied the test data processing algorithm,data presentation mode and database model,breaks through the disadvantages of only spectrum curve data in traditional electromagnetic radiation measurement,and realizes the multi-dimensional visual presentation and intelligent analysis of electromagnetic radiation distribution,electromagnetic radiation intensity and electromagnetic radiation spectrum.It also discusses the influence of near-field probe on the electromagnetic radiation results of high-speed storage chips at different distances,which is very important to the research of near-field radiation and further promotes the development of research and testing of new product.