摘要
提出了一种既考虑容量退化、又考虑内阻增长的SOH估计方法,用嵌入式系统中可以直接测量且计算不那么复杂的健康指标来表示。估计结果表明,该方法提高了估计精度47.59%以上,平均减少了29.20%的推理时间。在一个实际的嵌入式系统上使用多个数据集进行了所有测试,以验证所提方法的准确性和有效性。
In the paper,a SOH estimation method considering both capacity degradation and internal resistance growth,which is represented by health indicators that can be directly measured and calculated in embedded systems with less complexity.The results show that the proposed method improves the estimation accuracy by more than 47.59%and reduces the reasoning time by 29.20%on average.All tests are performed on a real embedded system using multiple data sets to prove and verify the accuracy and effectiveness of the proposed method.
作者
郝堃
谢雪莲
李显忠
肖杰
Hao Kun;Xie Xuelian;Li Xianzhong;Xiao Jie(Information Center of the First Affiliated Hospital of Chongqing Medical University,Yuzhong 400010,China;Meishan Power Supply Company,State Grid Sichuan Electric Power Company)
出处
《单片机与嵌入式系统应用》
2021年第10期45-48,53,共5页
Microcontrollers & Embedded Systems