微波集成电路低频噪声无损检测方法研究

Research on Nondestructive Testing Method of Low Frequency Noise in Microwave Integrated Circuits

传统的低频噪声无损检测方法在实际应用中,存在检测信号丢失、低频信号被平滑处理等问题,为解决上述问题,设计一种针对微波集成电路的低频噪声无损检测方法。通过定义低频噪声检测阈值范围的方式,结合信号的频带宽度,搭建微波集成电路低频噪声检测平台。同时,引进了小波转换技术,采用熵检测的方法,对电路白噪声与低频噪声进行分离处理,并将处理后的信号组进行重构。输出重构后的信号值,以此作为微波集成电路低频噪声无损检测结果。设计对比实验,对设计方法与传统方法的噪声检测结果进行对比,对比后发现,设计的方法在实际应用中,可清晰地表达电路噪声功率谱密度,解决信号丢失或低频信号被平滑处理等问题。

Traditional low-frequency noise nondestructive detection methods has problems such as losing detection signals and low-frequency signals are smoothed in practice.In order to solve these problems,a low-frequency noise nondestructive detection method for microwave,which integrated with circuits is designed.By defining the low-frequency noise detection threshold range and combining the bandwidth of the signal,a microwave integrated circuit low-frequency noise detection platform is built.At the same time,the wavelet transform technology has been introduced,which applies entropy detection method to isolate the white noise and low-frequency noise of the circuit,and reconstruct the processed signal group.The reconstructed signal value is the output of the nondestructive detection for the low frequency noise of the microwave integrated circuit.By designing a comparison experiment to contrast the noise detection results of the design method and the traditional method,it is found that the design method can clearly express the circuit noise power spectrum density in the practical applications and solve the problems of signal loss or low-frequency signals being smoothed.