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一种晶格相似相界面的结构测试技术

Structural measurement method of phase bondary planes with similar lattice parameter
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摘要 本研究属于体视学技术和晶界面结构之间的学科交叉。研究目的是精确解析多晶材料中晶格相似相界面的界面结构。以(La_(x)Ce_(1-x))B_(6)为例,研究方法是分别利用扫描电镜、电子背散射衍射(EBSD)和统计性的晶界结构分析方法,并充分注重:(1)LaB_(6)/CeB_(6)相界面的准确分离;(2)LaB_(6)/CeB_(6)相界面按照穿过相界面取向差角的准确分类;(3)通过五参数法,对LaB_(6)/CeB_(6)相界面做惯习面取向织构分析;(4)在惯习面取向织构和材料性能之间构建准确关联。研究结果首先包括晶格相似相界面的提取和分类技术与该种相界面的惯习面取向织构分析技术,并包括相界面的界面结构对材料性能的反馈,以及研究方法对其它类似界面结构的参考和借鉴。 The purpose of the research is to accurately analyze the structure of phase boundary planes with similar lattice parameters on the two sides of the boundary plane in polycrystalline materials.Taken(La_(x)Ce_(1-x))B_(6)as the example,the research method is using scanning electron microscopy,electron backscatter diffraction(EBSD)and statistical grain boundary structure analysis methods,respectively.The research method also pays high attention to:(1)Accurately separate the LaB_(6)/CeB_(6)phase boundaries;(2)Accurately sort the LaB_(6)/CeB_(6)phase boundaries according to the misorientation across the phase boundary planes;(3)Study the habit planes of the LaB_(6)/CeB_(6)phase boundary planes via five parameter analysis(FPA)method,and(4)Set accurate correlations between orientation texture of habit planes and the performances of the materials.The research results include the extraction and classification technology of phase boundary planes with similar lattice parameters across the boundary plane,and include orientation texture analysis technology of phase boundaries.The research results also provide feedback from interface structure of phase boundary planes to the material properties,and effective references towards other similar phase boundary structures.
作者 原效坤 吉元 YUAN Xiao-kun;JI Yuan(Faculty of Materials and Manufacturing,Beijing University of Technology,Beijing 100124,China)
出处 《电子显微学报》 CAS CSCD 北大核心 2021年第5期595-600,共6页 Journal of Chinese Electron Microscopy Society
基金 国家自然科学基金项目资助(No.51471007)。
关键词 扫描电子显微镜 电子背散射衍射 观测技术 相界面 相似晶格 scanning electron microscopy electron backscattered diffraction measurement method phase boundary plane similar lattice parameter
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