基于ATML的舰艇装备多状态测试系统设计

Design of Multi-state Test System for Naval Equipment Based on ATML

针对当前舰艇装备多状态测试系统的参数存在间断性,导致对舰艇装备测试的误差较大的问题,基于ATML设计了一种新的舰艇装备多状态测试系统;系统硬件由处理器、驱动器、传感器、监测器组成,选择麒麟990系列的处理器组成,能够有效降低内部负载,采用HDJ-8交流驱动器,内部引入2.7 kV、5.7 kW、10 kV三个级别电压,保证系统的电源电量,传感器是HDU传感器,功能齐全,监测器选用骁龙芯片,在无线通信功能的基础上实现状态监测;系统软件设计过程中,采用ATML技术实现舰艇装备多状态测试系统参数自检,保证参数的准确性及全面性;建立状态分量建模,通过分析文字文件、装备数据提取、状态检测实现舰艇装备多状态测试系统软件流程;实验结果表明,设计的基于ATML的舰艇装备多状态测试系统能够有效改善参数的间歇性,降低系统内部误差。

In view of the discontinuity in the parameters of the current multi-state test system for naval equipment,which leads to large errors in the test of naval equipment,a new multi-state test system for naval equipment is designed based on ATML.The system hardware is composed of processors,drivers,sensors,and monitors.Choosing Kirin 990 series processors can effectively reduce the internal load.HDJ-8 AC drives are used.Three levels of voltages of 2.7 kV,5.7 kW and 10 kV are introduced to ensure The power supply of the system and the sensor is an HDU sensor with complete functions.The monitor uses a Snapdragon chip to realize status monitoring based on the wireless communication function.In the system software design process,the ATML technology is used to realize the self-checking of the ship equipment multi-state test system parameters to ensure the accuracy and comprehensiveness of the parameters;establish the state component modeling,and realize the multi-state ship equipment State test system software flow.The experimental results show that the designed multi-state test system for naval equipment based on ATML can effectively improve the intermittency of parameters and reduce the internal errors of the system.