数字信号处理器单粒子功能性瞬态故障预估方法研究

An Estimation Method for Single Event Functional Transient Fault of Digital Signal Processor

结合特定应用下数字信号处理器单粒子功能故障的产生机理和表征模式,定义了单粒子功能性瞬态故障的概念,提出了利用数字信号处理器内部存储区数据位翻转截面和数据位缓存时间有效占比预估功能性瞬态故障截面的方法。在西安200 MeV质子应用装置上开展了TMS320C6455型数字信号处理器质子辐照实验,对预估方法的有效性进行了验证。实验得到了被测器件的功能性瞬态故障截面和内部存储区数据位翻转截面,并利用预估方法计算得到被测器件功能性瞬态故障截面预估值,实验结果与预估值相对偏差小于5%。

A method is proposed to estimate the single event functional transient fault(SEFT)cross section by combining the internal RAM single event upset(SEU)cross section of digital signal processor(DSP)with the effective time proportion of storage data.The proton irradiation experiment of TMS320C6455 digital signal processor is carried out at Xi’an 200 MeV Proton Application Facility(XiPAF),and the effectiveness of the prediction method is verified.The functional transient fault cross section and the internal RAM SEU cross-section of the tested device are obtained by the experiment,while the estimated values of the functional transient fault cross section of the tested device are calculated by the estimation method.The relative deviation between the experimental results of SEFT cross section and the estimated values is less than 5%.