摘要
Active control of the optical parameters in strontium titanate(SrTiO_(3),STO)thin films is highly desirable for tunable terahertz(THz)integrated devices such as filters,phase modulators,and electro-optical devices.In this work,optically tuned dielectric parameters of a STO thin film epitaxially grown on a silicon wafer were characterized in the THz region with an 800 nm laser pump-THz detection system.The refractive index,extinction coefficient,and complex dielectric constant of the STO thin film were calculated using thin-film parameter extraction.Owing to carrier transportation and soft-mode oscillation,the above optical parameters changed notably with the pump power of the external laser.This study is of great significance for rapid and non-contact THz phase-modulation technology and may serve as a powerful tool to tune the dielectric properties of the STO thin films.
作者
邹斌
李晴晴
杨玉平
郭海中
Bin Zou;Qing-Qing Li;Yu-Ping Yang;Hai-Zhong Guo(School of Science,Minzu University of China,Beijing 100081,China;School of Physics and Microelectronics,Zhengzhou University,Zhengzhou 450052,China;Optoelectronics Research Center,Minzu University of China,Beijing 100081,China;Collaborative Innovation Center of Light Manipulations and Applications,Shandong Normal University,Jinan 250358,China)
基金
supported by the National Natural Science Foundation of China(Grant No.62075248)
the National Key R&D Program of China(Grant Nos.2017YFB0405400 and 2020YFB2009300)
the Program for the Innovation Team of Science and Technology in University of Henan,China(Grant No.20IRTSTHN014).
