摘要
针对反熔丝FPGA端口测试复杂度高和稳定性差的问题,提出了一种基于ATE的反熔丝FPGA的端口测试方法,该方法仅使用一段特殊编程的测试码就可以测试出相应的电特性。经过ATE测试验证,该测试方法可以有效提高近32%的测试效率,测试的准确性也得到了保证。
This paper was aimed to solve the problems of high complexity and poor stability of test ports of an tifuse FPGA.The port test method of antifuse FPGA based on ATE was proposed,which can test the corres ponding electrical electrical parameters only by using a specially programmed test code.This method can effectively improve the test efficiency nearly 35%by this method,and the accuracy was guaranteed.
作者
李岱林
陈诚
Li Dai-lin;Chen Cheng(China Key System&Integrated Circuit Co.,Ltd.,Jiangsu Wuxi 214035)
出处
《电子质量》
2021年第10期36-40,共5页
Electronics Quality