微机电系统微摩擦测试技术研究

Research on Micro Friction Testing Technology of Micro-electro-mechanical System

为解决微机电系统存在的微摩擦问题,提出了一种以光反射为基础的微摩擦测试技术。探讨了该测试方法的基本原理和实施步骤,设计研发了微机电系统的微摩擦测试样机,详细分析了该测试系统计量标定的完整过程,最终得到了该系统的计量测试数据及曲线。通过对Cu-Si、Al-Si表面进行微摩擦实验测试,得到了Cu-Si、Al-Si表面的μm量级微摩擦系数,有效验证了该测试系统能够满足微机电系统微摩擦测试的需要,同时,也为微机构运动特性的理解及设计提供了依据。

In order to solve the problem of micro-friction in micro-electro-mechanical systems( MEMS),a micro-friction test technology based on light reflection was proposed. The basic principles and implementation steps of the test method were discussed,the test prototype was developed,the complete process of measurement and calibration of the test system was analyzed in detail,and finally the measurement data and curve of the test system were obtained. Through the micro-friction experiment test on the Cu-Si and Al-Si surfaces,the micron-level micro-friction coefficients of the Cu-Si and Al-Si surfaces were obtained. It provides a basis for the understanding and design of the micro-mechanism’s motion characteristics.