期刊文献+

加固显示器空气静电放电问题研究

Research on Air Electrostatic Discharge Problem Based on Rugged Display
下载PDF
导出
摘要 针对某加固显示器在空气静电放电(ESD)15 kV测试中显示屏幕出现亮线的问题,提出了一种有效的整改方法:即处理镀膜屏蔽玻璃与加固显示器外壳之间的搭接,包括:(1)建议镀膜屏蔽玻璃的边缘搭接方式为ITO膜层裸露或者有银浆边;(2)在不影响显示效果的情况下,增加镀膜屏蔽玻璃与加固显示器外壳之间导电衬垫的厚度。试验验证表明:此方法可以使加固显示器容易通过空气ESD 15 kV测试,也可为后续加固显示器的空气ESD设计提供技术支持,具有重要的实际意义。 A bright line appeared on the display screen of a rugged display in air Electrostatic Discharge(ESD)15 kV test.For the problem,an effective rectification method was proposed,which was to deal with the lap joint between the coated shielding glass and the shell of rugged display.It was included that:(1)The ITO film layer should be bare or have silver paste edge for the edge lap joint mode of the coated shielding glass,(2)The thickness of the conductive pads at the gap between the coated shielding glass and the shell of rugged display should increase in the case that the display effect could not be affected.The experiment results showed that:this method could make the rugged display pass the air ESD 15 kV test easily.It could also provide technical support for air electrostatic discharge design of subsequent rugged displays,showing important practical significance.
作者 赵丽 王光腾 陈建军 ZHAO Li;WANG Guangteng;CHEN Jianjun(The 55th Research Institute of China Electronics Technology Group Corporation,Nanjing 210016,CHN)
出处 《光电子技术》 CAS 2021年第3期223-227,共5页 Optoelectronic Technology
关键词 加固显示器 空气静电放电 镀膜屏蔽玻璃 搭接 导电衬垫 rugged display air ESD coated shielding glass lap joint conductive pads
  • 相关文献

参考文献10

二级参考文献59

  • 1李秀峰,邱扬,丁高.静电放电及其防护设计[J].国外电子测量技术,2006,25(2):9-12. 被引量:21
  • 2贺其元,刘尚合,陈京平.对空气静电放电的频域研究[J].军械工程学院学报,2006,18(4):25-28. 被引量:3
  • 3曲喜新.现代介质薄膜[J].电子元件与材料,1996,15(4):1-6. 被引量:2
  • 4雷磊,周永平,张宝华,彭炜.ESD对电子设备的危害及防护[J].装备环境工程,2007,4(2):81-84. 被引量:10
  • 5刘尚合,宋学君.静电及其研究进展[J].自然杂志,2007,29(2):63-68. 被引量:48
  • 6Rhoades W T.Avoidance of ESD effects[C]// IEEE International Symposium on EMC.Seattle,WA,USA:IEEE,1988:96-100.
  • 7Yoshiaki M,Taro N,Kozo Tetal.Soft ESD phenomena in GMR heads in the HDD manufacturing process[J].Journal of Electrostatics,2006,64(2):72-79.
  • 8Tabata Y,Tomita H.Malfunctions of high impedance circuits caused by electrostatic discharges[J].Journal of Electrostatics,1990,19(24):155-166.
  • 9Lachance J,Lawrence R,Stegner S.Strategies to improve confidence in immunity testing under CISPR24[C]// International Symposium on Electromagnetic Compatibility.Zurich,Switzertand:[s,n.],2001:84-88.
  • 10IEC 61000-4-2 International standard[S],2001.

共引文献55

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部