摘要
根据PIE技术基本原型,将软件系统中的对象抽象为PIE技术中的位置概念。以此作为模型的考察粒度,提出了扩展PIE模型。结合随机图理论,建立了基于扩展PIE的软件可测试性计算模型。
A new computation model for software testability by the extended PIE technique is put forward.PIE model is a basic dynamical computation method of software testability.This article considers object in software system as basic location of testability,changes research granularity in basic PIE model,and explains extended PIE model;It also combines random graph theory,and builds extended PIE based software testability estimating model.
作者
殷脂
YIN Zhi(School of Computer and Information Engineering,Shanghai University of Electric Power,Shanghai 200090,China)
出处
《上海电力大学学报》
CAS
2021年第6期573-576,共4页
Journal of Shanghai University of Electric Power
