摘要
Terahertz-(THz-)based electron manipulation has recently been shown to hold tremendous promise as a technology for manipulating and driving the next generation of compact ultrafast electron sources.Here,we demonstrate an ultrafast electron diffractometer with THz-driven pulse compression.The electron bunches from a conventional DC gun are compressed by a factor of 10 and reach a duration of~180 fs(FWHM)with 10,000 electrons/pulse at a 1 kHz repetition rate.The resulting ultrafast electron source is used in a proof-of-principle experiment to probe the photoinduced dynamics of single-crystal silicon.The THz-compressed electron beams produce high-quality diffraction patterns and enable the observation of the ultrafast structural dynamics with improved time resolution.These results validate the maturity of THz-driven ultrafast electron sources for use in precision applications.
基金
supported by the European Research Council under the European Union’s Seventh Framework Programme(FP7/2007-2013)through the Synergy Grant AXSIS(609920)
Project KA908-12/1 of the Deutsche Forschungsgemeinschaft,the Cluster of Excellence“CUI:Advanced Imaging of Matter”of the Deutsche Forschungsgemeinschaft(DFG)—EXC 2056—project ID 390715994
the Accelerator on a Chip Program(ACHIP)funded by the Gordon and Betty Moore Foundation(GBMF4744).
