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Morphology and orientation evolution of Cu_(6)Sn_(5)grains on(001)Cu and(011)Cu single crystal substrates under temperature gradient 被引量:2

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摘要 The morphology and orientation evolution of Cu_(6)Sn_(5)grains formed on(001)Cu and(011)Cu single crystal substrates under temperature gradient(TG)were investigated.The initial orientated prism-type Cu_(6)Sn_(5)grains transformed to non-orientated scallop-type after isothermal reflow.However,the Cu_(6)Sn_(5)grains with strong texture were revealed on cold end single crystal Cu substrates by imposing TG.The Cu_(6)Sn_(5)grains on(001)Cu grew along their c-axis parallel to the substrate and finally merged into one grain to form a fully IMC joint,while those on(011)Cu presented a strong texture and merged into a few dominant Cu_(6)Sn_(5)grains showing about 30°angle with the substrate.The merging between neighboring Cu_(6)Sn_(5)grain pair was attributed to the rapid grain growth and grain boundary migration.Accordingly,a model was put forward to describe the merging process.The different morphology and orientation evolutions of the Cu_(6)Sn_(5)grains on single crystal and polycrystal Cu substrates were revealed based on crystallographic relationship and Cu flux.The method for controlling the morphology and orientation of Cu_(6)Sn_(5)grains is really benefitial to solve the reliability problems caused by anisotropy in 3 D packaging.
出处 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2021年第36期29-39,共11页 材料科学技术(英文版)
基金 financially supported by the National Natural Science Foundation of China(Nos.52075072) the Fundamental Research Funds for the Central Universities(No.DUT20JC46)。
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  • 1M. N. Islam,Ahmed Sharif,Y. C. Chan.Effect of volume in interfacial reaction between eutectic Sn-3.5% Ag-0.5% Cu solder and Cu metallization in microelectronic packaging[J]. Journal of Electronic Materials . 2005 (2)
  • 2Jeong-Won Yoon,Bo-In Noh,Jae-Hyun Yoon,Han-Byul Kang,Seung-Boo Jung.Sequential interfacial intermetallic compound formation of Cu 6 Sn 5 and Ni 3 Sn 4 between Sn–Ag–Cu solder and ENEPIG substrate during a reflow process[J]. Journal of Alloys and Compounds . 2011 (9)
  • 3C.K. Wong,J.H.L. Pang,J.W. Tew,B.K. Lok,H.J. Lu,F.L. Ng,Y.F. Sun.The influence of solder volume and pad area on Sn–3.8Ag–0.7Cu and Ni UBM reaction in reflow soldering and isothermal aging[J]. Microelectronics Reliability . 2007 (4)
  • 4C. E. Ho,Y. W. Lin,S. C. Yang,C. R. Kao,D. S. Jiang.Effects of limited cu supply on soldering reactions between SnAgCu and Ni[J]. Journal of Electronic Materials . 2006 (5)
  • 5Chang, C.C.,Lin, Y.W.,Wang, Y.W.,Kao, C.R.The effects of solder volume and Cu concentration on the consumption rate of Cu pad during reflow soldering. Journal of Alloys and Compounds . 2010
  • 6Y.C.Hsu,Y.M.Huang,C.Chen,H.Wang. J.Alloy.Compd . 2006
  • 7Y.S.Park,Y.M.Kwon,J.T.Moon,Y.W.Lee,J.H.Lee,K.W.Paik. Proceedings of the 60th Electronic Components and Technology Conference . 2010
  • 8B.M.Chung,Y.H.Baek,J.Choi,J.Y.Huh. Journal of Electronic Materials . 2012
  • 9J.W.Xian,S.A.Belyakov,T.B.Britton,C.M.Gourlay. J.Alloy.Compd . 2015
  • 10J.W.Yoon,S.W.Kim,S.B.Jung. J.Alloy.Compd . 2006

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