利用轻基体样品散射谱估算X射线管光谱

An X-Ray Tube Spectrum Estimation Method Based on Scattering Spectrum of Light Matrix Sample

探讨了一种通过测量轻基体样品的散射谱估算X射线管原级谱方法。为了验证本方法的有效性,使用本方法计算了X射线管光谱,并将计算得到的光谱作为输人参数计算了多个轻基体样品的MC模拟谱图,然后分别与实测谱进行了比较。将X射线管实测能谱与本方法及半经验方法计算得到的能谐做了对比分析,结果显示本方法有效地实现对X射线管原级谱的准确估算。将多个轻基体样品的实测谱与MC模拟谱进行了对比分析,结果表明本方法大大提高了X射线荧光分析MC模拟结果的准确性。两个对比试验的结果表明,本方法能够实现X射线管光谱的准确计算,并显著地提高了用于X射线荧光分析的MC模拟结果的准确性。

A method for estimating the primary spectrum of X-ray tube by measuring the scattering spectrum of a light matrix sample is discussed.In order to verify the effectiveness of this method,the X-ray tube spectrum is calculated using this method,and the calculated spectrum was used as the input parameter to calculate the MC simulation spectra of multiple light matrix samples,and then compared with the measured spectra respectively.The measured energy spectrum of the X-ray tube is compared and analyzed with the energy spectrum calculated by this method and the semi-empirical method.The results show that this method effectively realizes the accurate estimation of the primary spectrum of the X-ray tube.The measured spectra of multiple light matrix samples are compared with MC simulation spectra.The results show that this method greatly improves the accuracy of the MC simulation results of X-ray fluorescence analysis.The results of the two comparative experiments show that the method can realize the accurate calculation of the X-ray tube spectrum and significantly improve the accuracy of the MC simulation results for X-ray fluorescence analysis.