摘要
提出一种基于动态应力-强度干涉模型和恒定应力加速试验相结合的可靠性定量预测方法。利用加速退化试验数据获得产品可靠度值,通过SSI模型外推得到产品在各应力水平下强度随时间退化的数据,并推导得出产品在动态环境作用下的可靠性变化趋势,有效解决了电子产品在动态时变环境下的可靠性预测难题,并通过仿真实例验证了方法有效性。
A quantitative reliability prediction method based on dynamic stress-strength interference model and constant stress accelerated test is proposed. The reliability of the product is obtained through constant stress accelerated degradation test,and the strength degradation data of products with time under various stress levels is extrapolated by SSI model,and then the reliability trend of products under dynamic environment can be deduced,which effectively solves the reliability prediction problem of electronic products under dynamic and time-varying environment. The effectiveness of the method is verified by simulation examples.
作者
张国龙
吕鑫
方远
石景岚
朱峰
ZHANG Guolong;LYU Xin;FANG Yuan;SHI Jinglan;ZHU Feng(State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System,Luoyang 471003)
出处
《舰船电子工程》
2022年第2期136-139,共4页
Ship Electronic Engineering
关键词
电子产品
应力-强度干涉模型
加速退化试验
可靠性预测
electronic products
stress-strength interference model
accelerated degradation test
reliability prediction
