电压反馈型运放电参数可靠性测试方法

Reliability Test Method for Electrical Parameters of Voltage-feedback Operational Amplifiers

芯片生产时由于工艺、设备客观存在的参数波动性造成成品中会存在有缺陷的芯片。装机时使用有缺陷的芯片严重时会损坏整机系统。电参数可靠性试验即为剔除芯片典型电参数超差而进行的筛选试验。针对这部分内容测试目前总结综述类文章较少且不全面的问题,文章总结电压反馈型运放环设计方法及运放的测试方法,对电压反馈型运算放大器电参数测试方法分析,结合模拟电路分析方法给出电压型反馈运放参数计算公式和测试原理,最后设计运放环对比某型号ATE配套运放环对AD公司高速运放AD8066ARZ进行典型电参数测试验证其正确性。

There are defective chips in finished products due to the parameter fluctuation of process and equipment. When the machine is installed,the defective chip will damage the whole system. Electrical parameter reliability test is a screening test to eliminate the typical electrical parameter out of tolerance. In view of the problems that the content of the test summary of the current articles is not comprehensive,the design method of voltage feedback operational amp ring and the test method of operational amp are summarized. Based on the analysis of the testing method of the voltage feedback operational amplifier,the calculation formula and testing principle of the voltage feedback operational amplifier parameters are given by combining with the analog circuit analysis method. Finally,the design of the operational amp ring is compared with a certain type of ATE operational amp ring,and the typical electrical parameters of the high-speed operational amp AD8066 ARZ of AD company are tested to verify its correctness.