基于LK8810平台的集成电路电参数测试方法设计与实现

Design and Implementation of Integrated Circuit Electrical Parameter Test Based on LK8810 Platform

阐述以LK8810作为测试平台,以74HC595为例,采用施加电流激励以测量电压的方法,为提高测量精度,输出采用开尔文连接的方式,根据所搭建的测量电路,利用测试专用函数编写程序实现对芯片输出高低电平上下限电参数的测试,测试结果可在上位机上显示。实验表明,该测试方案准确可靠,易于实施,可为数字芯片性能判断和缺陷分析提供可靠的数据依据。

Taking LK8810 as the test platform and 74 HC595 as an example, this paper adopts the method of applying current excitation to measure voltage. In order to improve the measurement accuracy, the output adopts Kelvin connection. According to the built measurement circuit, the program is written by using the special test function to test the upper and lower limit electrical parameters of the chip output high and low levels. The test results can be displayed on the upper computer. Experiments show that the test scheme is accurate, reliable and easy to implement, and can provide reliable data basis for digital chip performance judgment and defect analysis.