集成电路器件的检测与失效分析

Analysis of Detection and Failure for Integrated Circuit Devices

阐述集成电路在检测过程的特点,造成集成电路失效的几种形式,探讨电参数特性分析、失效分析的流程,精准定位每一失效产品的实际故障问题,从而制定针对性的解决策略。

This paper expounds the characteristics of integrated circuits in the detection process, several forms of integrated circuit failure, discusses the process of electrical parameter characteristic analysis and failure analysis, accurately locates the actual fault problems of each failed product, and then formulates targeted solutions.