基于静电力显微镜针尖电场诱导的电光发色团在主客体功能复合膜中的迁移

Observation of Field-induced Migration of Electro-optic Chromophores in Guest-host Composite Film Induced by Electric Force Microscopy

基于静电力显微镜(EFM)研究了针尖静电场诱导的电光发色团在聚碳酸酯(PC)功能复合膜中的迁移。在施加偏压的针尖强电场诱导下,原子力显微镜(AFM)形貌像和相位像表明客体分子逐渐从PC薄膜的本体向样品表面迁移,并形成纳米尺寸的小粒子。这一观察结果表明,外部电场可触发主客体功能复合材料中客体电光发色团的迁移,并导致复合材料微观结构和组成的不稳定,致使功能复合薄膜功能减弱,甚至失效。

The migration of electro-optic chromophores in polycarbonate(PC)composite film induced by electrostatic field was investigated by using an electric force microscope(EFM).The atomic force microscope(AFM)topographic and phase images show that the guest molecules gradually migrate from bulk polycarbonate film towards the sample surface and formed nanoparticles. This observation illustrates that the external electric field could trigger significant migration of guest molecules and lead to appreciable instability of microstructure and composition of the guest-host composites,which would cause the function of the composite film to weaken or even fail.