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亚分辨率辅助图形在0.11μm工艺上的应用

Application of Sub-resolution-assist-features in 0.11μm Process
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摘要 亚分辨率辅助图形(Sub Resolution Assist Features,SRAF)作为一种常用的分辨率增强技术(Resolution Enhancement Technique,RET),一般被应用于90nm及以下工艺节点。本文通过对SRAF规则(rule)的选择及验证,实现了0.11μm工艺在KrF光刻机上的量产。 Sub Resolution Assist Features(SRAF),as a common resolution enhancement technique(RET),is generally applied to process nodes of 90nm and below.In this paper,through the selection and verification of SRAF rule,the production of 0.11μm process on KrF lithography is achieved.
作者 张剑 王谨恒 王浩 陈洁 朱斌 曹楠 杨济硕 ZHANG Jian;WANG Jing-heng;WANG Hao;CHEN Jie;ZHU Bin;CAO Nan;YANG Ji-shuo(Csmc Technologies Co.,Ltd.;Mentor Electronic Technology Co.,Ltd.)
出处 《中国集成电路》 2022年第3期72-74,79,共4页 China lntegrated Circuit
关键词 SRAF 工艺窗口 DOF 0.11μm工艺平台 SRAF Process window DOF 0.11μm Process platform
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