基于STM32F429的AD静态参数自动测试系统的设计与实现

Design and Implementation of AD Static Parameter Automatic Test System Based on STM32F429

MCU内部集成的AD模块普遍应用于各类方案中,AD静态参数中的INL、DNL是评测AD性能的重要指标。使用专业仪器测试INL、DNL参数成本过高,因此用户对经济实惠且测试精准的专用测试台的需求日益显著。提供了一个低成本的AD静态参数自动测试系统设计方案,先阐述测试系统的基本实现原理,然后从硬件系统和软件系统两个部分详细介绍。实际使用证明,该测试系统适用于MCU AD模块的INL、DNL参数测试,工作稳定,测试精准,且成本低廉。

The AD module integrated inside the MCU is commonly used in various solutions.The INL and DNL in the AD static parameters are important indicators for evaluating AD performance.For the testing of INL and DNL parameters,the cost using professional instruments to test is too high,and the user's demand for economical and accurate test benches has become increasingly significant.Low-cost AD static parameter automatic test system design is provided.The basic realization principle of the test system is explained firstly,and then make a detailed introduction from the two parts of the hardware system and the software system.Practical use proves that the test system is suitable for the INL and DNL parameter testing of the AD module of the MCU,with stable work,accurate testing and low cost.