摘要
提出了一种用于降低触发电压的两级防护SCR(TSPSCR)。在传统LVTSCR中植入P-ESD层,增设额外的二极管。因为P-ESD层的掺杂浓度较高,该器件能更早发生雪崩击穿而触发第一级泄流路径,从而开启第二级泄流路径。Sentaurus TCAD仿真结果表明,该器件的触发电压从传统器件的10.59 V降低至4.12 V,维持电压为1.25 V,1 V直流电压下漏电流仅为7.85 nA。优化后的TSPSCR适用于先进1 V工作电压的电路中。
A two-stage protection SCR(TSPSCR) was proposed to reduce the trigger voltage. The P-ESD layer was implanted in the traditional LVTSCR, and an additional diode was added. Because of the higher doping concentration of P-ESD layer, the device could trigger the first-stage discharge path by avalanche breakdown earlier, thus opening the second-stage discharge path. The Sentaurus TCAD simulation results showed that compared with conventional SCRs, the device had a lower trigger voltage from 10.59 V to 4.12 V, a maintenance voltage of 1.25 V, and a leakage current of 7.85 nA at 1 V DC voltage. The optimized TSPSCR could be used in advanced circuits with 1 V operating voltage.
作者
张英韬
朱治华
范晓梅
毛盼
宋彬
许杞安
吴铁将
陈睿科
王耀
刘俊杰
ZHANG Yingtao;ZHU Zhihua;FAN Xiaomei;MAO Pan;SONG Bin;XU Qi’an;WU Tiejiang;CHEN Ruike;WANG Yao;LIOU Juin Jei(Integrated Circuit Reliability Design and ESD Protection Lab.,Zhengzhou University,Zhengzhou 450000,P.R.China;School of Automation and Information Engineering,Xi’an University of Technology,Xi’an 710000,P.R.China;Changxin Memory Technologies,Inc.,Hefei 230000,P.R.China)
出处
《微电子学》
CAS
北大核心
2022年第1期104-108,共5页
Microelectronics
基金
国家自然科学基金资助项目(61874098)。
关键词
ESD
SCR
两级防护
触发电压
漏电流
ESD
SCR
two-stage-protection
trigger voltage
leakage current