取向硅钢超大高斯晶粒取向偏离角的X射线衍射测量

X-ray diffraction measurement of orientation deviation angle of super-large Gaussian grain in oriented silicon steel

介绍了一种适用于超大晶粒取向硅钢的高斯晶粒取向偏离角的X射线衍射测量方法,提出了将试探法和探测器扫描法相结合的方式进行测量。结果表明:该方法可以同时获得准确的实际衍射角度和取向偏离角度,试样制备方式简单,对设备的要求低且测量结果准确。

This paper introduces a X-ray diffraction measurement method of Gaussian grain orientation deviation angle for ultra-large grain oriented silicon steel, and puts forward a method of combining the test method with the detector scanning. The results show that this method can obtain accurate actual diffraction angle and orientation deviation angle at the same time. The sample preparation method is simple, the requirements for equipment are low, and the measurement results are accurate.