基于成像/光强变化响应的中/短波红外辐射校准系统设计

Design of Medium/Short Wave Infrared Radiation Calibration System Based on Imaging/Light Intensity Change Response

受到测量方法的限制,现有的辐射校准系统只能在小-中型红外成像模拟器光学系统的透过率发生变化时实现辐射测量,无法在大型红外成像模拟器的视场光阑发生变化时实现辐射测量。针对大型红外成像模拟器部分仿真状态无法评估的问题,提出基于成像/光强变化响应的测量方法,并设计新型红外辐射校准系统。系统研制完成后,针对红外成像模拟器多辐射参数测量的需求,提出多参数标定方法进行系统标定。系统的辐射照度为6×10^(-10)~7×10^(-4)W/cm^(2),工作波段为2.05~2.55μm和3.70~4.80μm,测量不确定度为1.88%。最后,利用新系统校准大型红外成像模拟器在不同仿真状态下的输出辐射。校准结果表明,新方法和新系统可以使大型红外成像模拟器在全仿真状态下实现多参数测量。

Due to the limitation of measurement methods,the existing radiation calibration system can only realize radiation measurement when the transmittance of the optical system of small-medium infrared imaging simulator changes,but not when the field-of-view aperture of large infrared imaging simulator changes.Aiming at the problem that part of the simulation state of the large-scale infrared imaging simulator cannot be evaluated,a measurement method based on imaging/light intensity change response is proposed,and a new infrared radiation calibration system is designed.After the development of the system is completed,a multi-parameter calibration method is proposed to meet the requirements of multi-radiation parameter measurement for infrared imaging simulator.The irradiance of the system is 6×10^(-10)-7×10^(-4)W/cm^(2),the working band is 2.05-2.55μm and 3.70-4.80μm,and the measurement uncertainty is 1.88%.Finally,the new system is used to calibrate the output radiation of a large-scale infrared imaging simulator under different simulation states.The calibration results show that the new method and new system can make the large-scale infrared imaging simulator realize multi-parameter measurement in full simulation state.