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Accurate structure determination of nanocrystals by continuous precession electron diffraction tomography

利用连续旋转旋进电子衍射断层扫描确定纳米晶的确切结构
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摘要 Structures are the cornerstones of structure-function relationship research of materials.After more than a hundred years of development,single crystal X-ray diffraction(SC-XRD)becomes the most common method to determine structures of materials.Nevertheless,the weak interaction between X-ray and matter requires crystals to be larger than 5μm ×5μm × 5μm for normal SC-XRD diffractometer.Recent appearances of X-ray free electron lasers(XFEL)and micro-focused synchrotron beamlines allow SC-XRD data collection from micron-sized crystals,but access to these facilities is limited.The development of three-dimensional(3D)electron diffraction(ED)has provided a powerful tool for scientists to explore the microcosmos,extending the limit of the SC-XRD method[1]. 三维电子衍射已逐渐成为人们探索微观世界的强有力的工具.本文中,我们展示了一种新的三维电子衍射数据收集方法,命名为连续旋转旋进电子衍射断层扫描(cPEDT),该方法是旋进电子衍射断层扫描(PEDT)与连续旋转电子衍射(cRED)的结合.使用cPEDT方法,可以避免PEDT方法中步进式过程引入的不必要的电子剂量,同时利用cPEDT收集到的数据也可以进行动力学精修从而确定材料的精确结构.该方法可以促进三维电子衍射在一些电子束敏感材料上的应用,如金属-有机框架(MOF)、共价有机框架(COF),以及一些有机物.
作者 Yihan Shen Wenjia Sun Yang Liu Zhengyang Zhou Junliang Sun 沈弈寒;孙文甲;刘扬;周钲洋;孙俊良(State Key Laboratory of Rare Earth Materials Chemistry and Applications,College of Chemistry and Molecular Engineering,BNLMS,Peking University,Beijing 100871,China;Shanghai Institute of Ceramics,Chinese Academy of Sciences,Shanghai 201899,China;ReadCrystal Biotech.,Suzhou 215500,China)
出处 《Science China Materials》 SCIE EI CAS CSCD 2022年第5期1417-1420,共4页 中国科学(材料科学(英文版)
基金 supported by the National Basic Research Program of China (2020YFA0210700 and 2016YFA0301004) the National Natural Science Foundation of China (21871009, 21527803, 22125102, and 22105218) Shanghai Sailing Program (21YF1454400)。
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