摘要
简述了X射线衍射测定残余应力的原理,研究了不同摆动参数设置对不同晶粒度样品残余应力测试的影响,并分析了影响机理。结果表明:摆动参数对无应力粉末以及细晶材料的残余应力测试影响不大,对较大晶粒材料有明显影响:在测试较大晶粒的材料时,应选择更大的摆动参数。
The principle of residual stress measurement by X-ray difraction is briefly described,the infuence of different oscillation parameter settings on residual stress measurement of samples with different grain sizes is studied,and the infuence mechanism is analyzed.The results show that the oscillation parameters have itte efect on the residual stress measurement of stress-free powders and fine-grained materials,but have significant effect on the materials with larger grain.Larger oscillation parameters should be selected when testing materials with larger grains.
作者
黄丹蓝
李丽敏
王颖
张鸿通
HUANG Danlan;LI Limin;WaNG Ying;ZHANG Hongtong(Beijing Beiye Functional Materials Corporation,Beijing 100192)
出处
《金属材料研究》
2022年第1期41-44,共4页
Research on Metallic Materials
关键词
X射线衍射
摆动参数
晶粒度
应力测试方法
X-tay difraction
OSsillation paracters
grain size
method of stress testing