摘要
The rapid development of high-intensity laser-generated particle and photon secondary sources has attracted widespread interest during the last 20 years not only due to fundamental science research but also because of the important applications of this developing technology.For instance,the generation of relativistic particle beams,betatron-type coherent X-ray radiation and high harmonic generation have attracted interest from various fields of science and technology owing to their diverse applications in biomedical,material science,energy,space,and security applications.In the field of biomedical applications in particular,laser-driven particle beams as well as laser-driven X-ray sources are a promising field of study.This article looks at the research being performed at the Institute of Plasma Physics and Lasers(IPPL)of the Hellenic Mediterranean University Research Centre.The recent installation of the ZEUS 45 TW laser system developed at IPPL offers unique opportunities for research in laser-driven particle and X-ray sources.This article provides information about the facility and describes initial experiments performed for establishing the baseline platforms for secondary plasma sources.
基金
support of this work by the project‘ELI-LASERLAB Europe Synergy,Hi PER&IPERIONCH.gr’(MIS 5002735)which is implemented under the Action‘Reinforcement of the Research and Innovation Infrastructure’
funded by the Operational Programme‘Competitiveness,Entrepreneurship and Innovation’(NSRF 2014–2020)
co-financed by Greece and the European Union(European Regional Development Fund)
supported by computational time granted from the Greek Research and Technology Network(GRNET)in the National HPC facility,ARIS,under project ID pr009023-La MIPla S III
cofinanced by the European Regional Development Fund of the European Union and Greek national funds through the Operational Program Competitiveness,Entrepreneurship,and Innovation,under the call Research–Create–Innovate(project code:T1EDK-04549,project title:Development of a coherent X-ray multispectral microscopy system)。
