基于ATE的高速RapidIO交换芯片测试方法

The Test Method of High-speed RapidIO Switching Chip Based on ATE

RapidIO交换芯片因其出色的延迟及高可靠性而被广泛地应用于各种通信系统中,可以高速地传输系统内各种设备间的数据。基于ATE测试系统对RapidIO交换芯片的测试内容及方法进行了探讨,尤其是对高速串行接口相关参数的测试方法进行了研究,并采用高速RapidIO交换芯片开展了测试验证。

RapidIO switch chip is widely used in various communication systems because of its excellent delay and high reliability,and it can transfer data between devices in a system at high speed.Its test content and method are discussed based on ATE test system,especially the test method of high-speed serial interface parameters is studied,and a high-speed RapidIO switch chip is used to carry out test verification.