基于SSD控制器芯片测试平台转移及测试向量转换的方法

Methods about Test Platform Transfer and Test Pattern Conversion Based on SSD Controller Device

随着集成电路测试成本的提高,将芯片从高性能的自动化测试设备(Automation Test Equipment,ATE)向低一级ATE进行转移可以节省相应的测试成本。测试平台转换过程中涉及测试程序的开发和测试向量的转换,将两个测试平台得到的测试数据进行比对,验证了转换后测试程序的有效性与准确性。基于一款高性能的28 nm固态存储硬盘(Solid State Drive,SSD)控制器,测试平台从爱德万(Advantest)的V93K转移至泰瑞达(Teradyne)的J750,同时使用Python脚本进行向量转换和测试数据的比对分析,达到了降低芯片测试成本的目的。

As the cost of integrated circuit testing increases,the transfer of chips test from high-performance automation test equipment(ATE)to lower-level ATE can save corresponding test costs.The ATE transfer process involves the development of test programs and the conversion of test pattern.The test data obtained from the two different ATEs are compared to verify the validity and accuracy of the ATE transfer process(named as correlation).This study is based on a high-performance 28 nm solid state drive(SSD)controller.The test platform is transferred from Advantest's V93K to Teradyne's J750,and some Python scripts are used for pattern conversion and correlation of test data,to achieve the goal of reducing the cost of chip testing.