基于Verigy 93000 ATE的多通道一致性测试

Multi-channel Conformance Testing Based on Verigy 93000 ATE

随着集成电路设计技术的发展以及半导体制造工艺能力的快速提升,高速大规模的集成电路器件不断涌现。对这类器件的测试能力也提出了更高的要求。常规的采用示波器的模式,不能很好的适应多通道的一致性测试。在本文中探讨了如何基于Verigy 93000 ATE实现高速集成电路的多通道一致性测试。

With the development of integrated circuit design technology and rapid ascension of semiconductor manufacturing process capability,high speed large scale integrated circuit devices.for this kind of device testing capability also put forward higher requirements.a regular use of the oscilloscope mode,can’t adapt to the consistency of the multi-channel test good.In this article discusses how to implement high speed integrated circuit multi-channel conformance testing based on Verigy 93000 ATE.