电子元器件缺陷检测技术研究与开发

Research and development of defect detection technology for electronic components

目前,电子元器件缺陷的检测大多都是对其内部和外部进行检测,内部检测难度比较大,检测参数和检测过程较为复杂、麻烦,而且内部的参数有时候后不能准确地进行检测;而外观缺陷检测大多数只通过人眼或显微镜进行人工观察,效率低下,浪费人力物力;为此通过对电子元器件的内部和外部缺陷进行检测判断是否存在性能参数失效,以及利用数字图像处理技术对电子元器件外观缺陷进行检测和分析。具体地,明确内部参数检测原理和外部检测主要结构与功能,外部检测主要获取图像进行分析,同时,执行图像分割与降噪处理,借助于生成的灰度共生矩阵将纹理特征值计算出来,与预存储缺陷数据进行比对,明确元器件的外部具体缺陷情况。

At present,most of the defect detection of electronic components are internal and external detection.The internal detection is difficult,the detection parameters and detection process are complex and troublesome,and the internal parameters sometimes can not be detected accurately;However,most of the appearance defects are only observed manually through human eyes or microscope,which is inefficient and wastes human and material resources;Therefore,the internal and external defects of electronic components are detected to judge whether there is performance parameter failure,and the appearance defects of electronic components are detected and analyzed by digital image processing technology.Specifically,the principle of internal parameter detection and the main structure and function of external detection are clarified.The external detection mainly obtains the image for analysis.At the same time,the image segmentation and noise reduction processing are performed.The texture eigenvalues are calculated with the help of the generated gray level co-occurrence matrix and compared with the pre stored defect data to clarify the specific external defects of the components.