SHINE丝扫描截面测量系统样机数据采集系统研制

Development of data acquisition system for prototype of SHINE wire scanner system

上海高重复频率硬X射线自由电子激光装置(Shanghai HIgh repetition rate XFEL aNd Extreme light facility,SHINE)使用低温超导高频腔加速电子,电子能量可以到达8 GeV。对于SHINE的电子束团横向截面测量将使用丝扫描这种半拦截式的截面测量方法,产生的次级粒子数量较拦截式测量方法(如截面靶小)可以减小超导腔失超的风险,但需要实现束损探测器的信号与电机位置同步采集。本文基于Zynq-UltraScale+型片上系统设计与实现了丝扫描系统数据采集系统,首先对该数据采集系统的实现方式作了详细描述,然后利用实验平台检验了电机位置测量的正确性,并验证了同步采集探测器信号和扫描丝位置的功能。实验结果表明:该数据采集系统可以满足SHINE丝扫描截面测量系统的运行要求。

[Background]The Shanghai high repetition rate XFEL and extreme light facility(SHINE)accelerates electrons up to 8 GeV using cryogenic-superconducting high-frequency cavity.Wire scanner system is applied to the beam profile measurement of SHINE due to its advantages such as fewer secondary particles generation compared with that of complete beam block,hence reduce the risk of superconducting cavity.[Purpose]This study aims to design data acquisition system for wire scanner system and realize synchronous acquisition of beam loss signal and relative position between the wire and beam.[Methods]The data acquisition system for wire scanner was designed to include radio frequency(RF)daughter board with analog signal digitizer,digital motherboard,firmware,data processing software.A Zynq-UltraScale+based system on chip(SoC)was employed as system central component,and a field programmable gate array(FPGA)was used for system control and data transmission whilst the advanced RISC machine(ARM)integrating Linux was implemented for data acquisition and communication.Finally,experimental test of this data acquisition system was performed on the testbed to verify its feasibility and functionalities.[Results]The data acquisition system can correctly read back position of grating ruler,and achieve synchronous acquisition of sample beam loss signal and signal of cavity beam position monitor.[Conclusions]The data acquisition system meets the requirements of SHINE wire scanner system.It will be applied to the prototype of SHINE wire scanner system.