摘要
面向科研领域应用的CMOS图像传感器,需要具有低噪声、高动态范围和高灰度分辨率的特点.本文分析了多通道扩展计数ADC结构的性能,提出了一种基于相关多采样技术(Correlated Multiple Sampling,CMS)的15位四通道扩展计数ADC.该ADC的4个并行输入通道采用增量型ADC,第二级采用1个循环型ADC在通道间复用.ADC电路基于0.11μm CMOS工艺进行设计,仿真结果显示,在128次多采样下,ADC的分辨率为15位,信号信噪比可提高9.22 dB,此时积分非线性(INL)和微分非线性(DNL)分别为-3.32 LSB和-2.58 LSB,4通道最高采样率为133 KSPS,在3.3 V电源电压下,平均每通道功耗为650μW.
A 15-bit 4-channel extended counting(EC)ADC with correlated multiple sampling(CMS)is designed for low-noise column readout in scientific CMOS image sensors(CISs).The 4-channel EC ADC structure is composed of 4 IncrementalΔΣADCs(IADCs)working in parallel and a cyclic ADC to increase the readout speed.The ADC is designed and implemented in a 0.11μm CMOS process.The readout speed of the 4-channel EC ADC is 133KSPS at 5MHz clock frequency.Simulation results show that the maximum INL and DNL of the ADC with 128 times multiple sampling are-3.32 and-2.58 LSBs,and the CMS brings forth a 9.22 dB improvement in SNR.The power consumption is 650μW per channel at 3.3 V supply voltage.
作者
李明
尹韬
蔡刚
高同强
冯鹏
刘力源
吴南健
LI Ming;YIN Tao;CAI Gang;Gao Tongqiang;FENG Peng;LIU Liyuan;WU Nanjian(Aerospace Information Research Institute,Chinese Academy of Sciences,Beijing 100094,China;School of Electronic,Electrical and Communication Engineering,University of Chinese Academy of Sciences,Beijing 100049,China;State Key Laboratory of Superlattices and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China;School of Microelectronics,University of Chinese Academy of Sciences,Beijing 100049,China;College of Materials Sciences and Opto-Electronic Technology,GUCAS,Beijing 100049,China)
出处
《微电子学与计算机》
2022年第6期115-123,共9页
Microelectronics & Computer
基金
国家自然科学基金(61974146,61874107)
国家重点研发计划项目(2019YFB2204303)。