摘要
针对逐次逼近型模数转换器(Successive Approximation Register Analog-to-Digital Converter,SAR ADC)中电容失配引起转换精度降低的问题,提出了基于扰动的高精度SAR ADC校准算法.SAR ADC采用整数权重非二进制结构的分段电容阵列,在未增加额外冗余电容的情况下可实现误差容错的冗余功能,提高了SAR ADC输入信号的摆幅与转换精度.仿真结果表明,该校准算法将无杂散动态范围(Spurious-Free Dynamic Range,SFDR)从60.0 dB提升到106.3 dB,将有效位数(Effective Number of Bits,ENOB)从9.28 bit提升到13.75 bit,仿真结果验证了校准算法的正确性和有效性.
Aiming at the problem of reduced conversion accuracy caused by capacitance mismatch in Successive Approximation Register Analog-to-Digital Converter(SAR ADC), a perturbation-based highprecision SAR ADC calibration algorithm is proposed. The SAR ADC adopts a segmented capacitor array with integer-weight-based and non-binary structure. It can realize the redundancy function of error tolerance without adding additional redundant capacitors and improve the swing and conversion accuracy of the input signal for SAR ADC. The simulation results show the calibration algorithm improves the Spurious-Free Dynamic Range(SFDR) from 60.0 to 106.3 dB, and the Effective Number Of Bits(ENOB) is raised from9.28 to 13.75 bit. The simulation results verify the correctness and effectiveness of the calibration algorithm.
作者
刘宇航
曹晓东
张雪莲
张其鑫
LIU Yuhang;CAO Xiaodong;ZHANG Xuelian;ZHANG Qixin(Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China;University of Chinese Academy of Sciences,Beijing 100049,China)
出处
《北京交通大学学报》
CAS
CSCD
北大核心
2022年第2期46-53,共8页
JOURNAL OF BEIJING JIAOTONG UNIVERSITY
基金
国家重点研发计划(2021YFF0700203)。
关键词
微电子学与固体电子学
SAR
ADC
电容失配
数字校准
分段
microelectronics and solid state electronics
SAR ADC
capacitance mismatch
digital calibration
segmentation