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Evolution of optical properties and molecular structure of PCBM films under proton irradiation

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摘要 Low-energy proton irradiation effects on the optical properties and the molecular structure of phenyl-C_(61)-butyric acid methyl ester(PCBM)are studied in this work.The PCBM films are irradiated by 100-keV proton beams with fluences of 5×10^(12)p/cm^(2),5×10^(13)p/cm^(2),and 5×10^(14)p/cm^(2),respectively.The photoluminescence(PL)peaks of the post-irradiated PCBM films show a progressive decrease in the peak intensity as the proton fluences increase,which can be attributed to the deep defect levels induced by proton irradiation.Additionally,a slight blue-shift in the PL spectrum is also observed at a proton fluence of 5×10^(14)p/cm^(2).The underlying mechanism can be traced back to the lift of the lowest unoccupied molecular orbital(LUMO)level,which is caused by the attachment of methoxy radicals on ortho position of the phenyl ring in the post-irradiated PCBM structure.This work is of significance in understanding the radiation hardness and the damage mechanism of the PCBM film in radiation environments,which is essential before it is put into practical application in space.
作者 Guo-Dong Xiong Hui-Ping Zhu Lei Wang Bo Li Fa-Zhan Zhao Zheng-Sheng Han 熊国栋;朱慧平;王磊;李博;赵发展;韩郑生(Key Laboratory of Science and Technology on Silicon Devices,Institute of Microelectronics,Chinese Academy of Sciences,Beijing 100029,China;University of the Chinese Academy of Sciences,Beijing 100049,China)
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第5期582-587,共6页 中国物理B(英文版)
基金 Project supported by the Youth Innovation Promotion Association,Chinese Academy of Sciences the National Natural Science Foundation of China(Grant No.61874135) the Foundation of Frontier Science of the Chinese Academy of Sciences(Grant No.ZDBS-LY-JSC015)。
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