基于PCAP04的电容式折射率测量仪

Capacitive Refraction Index Measuring Instrument Based on PCAP04

针对目前折射率测量仪精度较差,成本高等问题,提出基于PCAP04的电容式折射率测量仪。该系统以电容传感器和PCAP04芯片为主要元器件,通过捕捉电容值的变化,达到精确测量大气折射率的目的。将高精度微波折射率测量仪、电容式折射率测量仪和基于PCAP04的电容式折射率测量仪对比,结果表明电容式折射率测量仪电路设计简易程度低于另外两种仪器,精度高于现有电容式折射率测量仪,具有设计简单、成本较低、抗干扰强、精度高的等优点。

Aiming at the problem of poor precision and high cost of refractive index measuring instrument,a capacitive transmittance measuring instrument based on PCAP04 was proposed.The system used capacitance sensor and PCAP04 chip as the main components,which could accurately measure atmospheric refractive index by capturing the change of capacitance value.Finally,the high-precision microwave refractive index measuring instrument,capacitive refractive index measuring instrument and the new type of capacitive refractive index measuring instrument based on PCAP04 were compared to each.The results showed that the new type of capacitive refractive index measuring instrument was of easier circuit design than the other,and with higher accuracy.