基于二值条纹的快速高精度三维成像系统的研究

Research on fast and high-precision 3D imaging system based on binary fringes

文章提供一种基于离焦二值条纹的快速高精度的三维测量系统,通过离焦投影3幅二值条纹图和1幅二值散斑图实现相位展开。在相位展开框架中采用散斑匹配的方法找出参考散斑图和当前散斑图的对应关系,采用改进的PatchMatch匹配算法来进行散斑匹配,利用图形处理器对匹配算法进行并行加速。在图形处理器Nvidia GTX1060上进行加速实验,整个相位展开所需的时间仅为5.13 ms,在距离被测物体110 cm远处,三维重建的均方根误差为0.27 mm。实验结果表明,该系统在快速高精度应用场景中具有较大的应用潜力。

This paper presents a fast and high-precision 3D measurement system based on defocused binary fringes.Phase unwrapping is accomplished by defocusing three binary fringe patterns and a binary speckle pattern.In the phase unwrapping framework,the speckle matching method is used to find the correspondence between the reference speckle image and the current speckle image.The improved PatchMatch matching algorithm is used for speckle matching,and the matching algorithm is accelerated in parallel on the GPU.The acceleration experiment was carried out on Nvidia GTX1060,and the time required for the entire phase unwrapping was only 5.13 ms.At a distance of 110 cm from the measured object,the root mean square error of the 3D reconstruction was 0.27 mm.Experiments show that the system has great potential in fast and high-precision application scenarios.