摘要
一套理想的EMC测量系统,应该在每次对同一个符合稳定性要求的质控样品进行测试时,只产生“正确”的测量结果,而且随着时间的推移,测量结果也不会发生偏离,始终保持稳定状态。针对EMC测量系统,探讨如何利用统计过程控制技术(SPC技术),结合MINITAB软件来识别EMC测量系统的性能偏离。着重介绍了预控制图、I-MR控制图和X-S控制图三种控制图的具体应用,为EMC检测实验室的日常质量控制提供参考。
An ideal EMC measurement system should produce only"correct"measurement results each time when the same quality control sample which meets the stability requirements is used,and the measurement results will not deviate over time,and always remain stable.This paper discusses how to use statistical process control technology(SPC technology)and MINITAB software to identify the performance deviation of EMC measurement system.The application of three control charts,named pre-control chart,I-MR control chart and X-S control chart,is emphatically introduced,which can provide reference for daily quality control of EMC testing laboratory.
关键词
统计过程控制
EMC测量系统
性能偏离
statistical process control(SPC)
EMC measurement system
performance deviation
