摘要
TEM小室法和IC带状线法是目前集成电路辐射发射测试中的两种典型方法,测试方法的选用和对测试结果的处理是两种测试方法易混乱之处。基于两种测试方法的原理,分析了测试结果关联关系、IC高度和电压驻波比对测试结果的影响。测试数据表明,两种测试方法归一化后的测试结果基本一致,IC高度和电压驻波比对两种测试方法的测试结果有不同程度的影响,最后给出两种测试方法的选用建议。研究结果可为制造商、测试机构及用户等相关人员提供参考,有利于集成电路辐射发射性能评估的一致性。
The TEM cell method and the IC stripline method are two typical test methods in the IC radiated emission test at present.The choice of the test method and the processing of the test results are the confusing points of the two test methods,this paper is based on the principle of two test methods,the relationship between the test results,the influence of IC height and VSWR on the test results are analyzed,and the test results are verified by the test platform of the two methods.The test data show that the normalized test results of the two test methods are basically the same,and IC height and VSWR have different degrees of influence on the test results of the two test methods.Finally,suggestions for the selection of the two test methods are proposed.The research results provide a reference for manufacturers,test institutions and users,and are beneficial to the consistency of the radiated emission performance evaluation of integrated circuits.
