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一种低功率点测试方案在玩具电子电路故障试验中的应用 被引量:3

Application of a Low-power Points Measuring Method in Electronic Circuit Fault Test of Electric Toys
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摘要 电玩具中电子电路低功率点的测定是电玩具检测中判断是否进行模拟故障试验的重要依据。根据国内外玩具安全标准GB 19865、IEC 62115、EN 62115和ASTM F963电子电路模拟故障试验要求,本文提出一种采用数字功率计连接可变电阻的准确高效测试电玩具中电子电路低功率点方案,并通过应用软件同步获取测试过程参数的趋势图。在对本测试方案的基本原理、试验条件、测试流程、仪器设备、数据处理和符合性评定研究的基础上,对其科学性和可行性进行了有效验证。结果表明,该测试方案稳定可靠,测试结果能够准确反映电气参数的动态响应,解决了使用示波器测量时电压探头和电流探头之间传输延迟导致测量偏差的难题。该方法为玩具电子电路故障试验中低功率点的测定提供了一种有效的检测技术路径。 The determination of low-power points in electric toys’ electronic circuits was an important basis for judging whether to carry out the fault condition test. According to the requirement for electronic circuit fault condition test of toy safety standards including GB 19865, IEC 62115, EN 62115 and ASTM F963, this paper proposed an accurate and efficient method for testing low-power points of electronic circuits in electric toys by using a digital power meter to connect a variable resistor. The trend chart of test process parameters was obtained synchronously on the application of the related software. After careful examination of its basic principles, test conditions, test procedures, instrumentation and equipments, data processing and conformity assessment, the scientificity and feasibility of such method were herein verified. The study showed that the new method was stable, reliable and could accurately reflect the dynamic response of electrical parameters, which could provide measuring technique support for low-power points test in toy fault conditions. This method provided an effective detection technique for the determination of low-power points in the electronic circuit fault conditions test of electric toys.
作者 林鹏辉 王璨 张华扬 刘嘉奕 漆志民 刘伟 LIN Peng-Hui;WANG Can;ZHANG Hua-Yang;LIU Jia-Yi;QI Zhi-Min;LIU Wei(Shantou Customs District Technology Center,Shantou 515800)
出处 《中国口岸科学技术》 2022年第6期28-34,共7页 China Port Science and Technology
基金 汕头海关科技项目(2020STK011)。
关键词 模拟故障试验 低功率点的测定方法 验证试验 电气参数 动态响应 fault condition test low-power point measuring method verification test electrical parameters dynamic response
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