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Adaptive semi-empirical model for non-contact atomic force microscopy

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摘要 Non-contact atomic force microscope is a powerful tool to investigate the surface topography with atomic resolution.Here we propose a new approach to estimate the interaction between its tips and samples,which combines a semi-empirical model with density functional theory(DFT)calculations.The generated frequency shift images are consistent with the experiment for mapping organic molecules using CuCO,Cu,CuCl,and CuO_(x)tips.This approach achieves accuracy close to DFT calculation with much lower computational cost.
作者 Xi Chen Jun-Kai Tong Zhi-Xin Hu 陈曦;童君开;胡智鑫(Center for Joint Quantum Studies and Department of Physics,Institute of Science,Tianjin University,Tianjin 300350,China;State Key Laboratory of Precision Measuring Technology and Instruments,Tianjin University,Tianjin 300072,China)
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第8期682-687,共6页 中国物理B(英文版)
基金 Project supported by the National Nature Science Foundation of China(Grant No.11804247)。
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