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稳定剂对40Mo-ZrO_(2)金属陶瓷结构及导电性能的影响 被引量:2

Effects of stabilizers on the microstructure and conductivity of the 40Mo-ZrO_(2) cermet
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摘要 为减轻ZrO_(2)可逆相变对40Mo-ZrO_(2)金属陶瓷结构和性能的影响,在ZrO_(2)陶瓷基体中分别添加3%Y_(2)O_(3)和12%CeO_(2)的稳定剂,通过粉末冶金方法获得金属陶瓷烧结体,分析添加稳定剂对金属陶瓷试样的微观结构及导电性能的影响。结果表明,在陶瓷基体中添加Y_(2)O_(3)和CeO_(2)稳定剂后,组分中出现明显的四方氧化锆,烧结体颗粒的尺寸有所增加,金属相网状结构更加明显,提高了烧结体密度,降低了烧结体孔隙率,烧结体电导率有所提高;随着温度升高,金属陶瓷电导率有所降低,且电导率随温度的变化率逐渐减小,金属陶瓷电导率主要呈现金属相电子导电机理。 In order to reduce the influence of the reversible phase transition of zirconia on the structure and performance of 40Mo-ZrO_(2)cermet,3%Y_(2)O_(3)and 12%CeO_(2)stabilizers were added to the ZrO_(2)ceramic matrix.The 40MoZrO_(2)cermet samples were prepared by powder metallurgy,and the effect of stabilizers on the microstructure and electrical conductivity of cermet was studied.The results indicate that the addition of Y_(2)O_(3)and CeO_(2)stabilizers to the ceramic matrix lead to the appearance of amount of tetragonal zirconia phase,the size of the sintered particles increases,and the metal phase network structure is more obvious.And also lead the density of cement increase,the porosity is reduced slightly and the electrical conductivity decreases.With the increase of temperature,electrical conductivity of cermet decreases,and the range of change of conductivity also gradually decreases.The electrical conductivity of cermet mainly presents the electronic conduction mechanism of the metal phase.
作者 李建朝 齐素慈 唐磊 许继芳 LI Jianchao;QI Suci;TANG Lei;XU Jifang(Department of Intelligent Manufacturing,Hebei College of Industry and Technology,Shijiazhuang 050091,China;State Key Laboratory of Advanced Special Steel,Shanghai University,Shanghai 200072,China;School of Iron and Steel,Soochow University,Suzhou,215137,China)
出处 《粉末冶金工业》 CAS 北大核心 2022年第4期51-56,共6页 Powder Metallurgy Industry
基金 国家自然科学基金资助项目(51704201) 河北省高等学校科学研究计划青年基金资助项目(QN2020161) 河北工业职业技术学院自然科学项目(ZRY2017001) 省部共建高品质特殊钢冶金与制备国家重点实验室、上海市钢铁冶金新技术开发应用重点实验室开放课题(SKLASS 2019-10) 上海市科学技术委员会资助课题(19DZ2270200)。
关键词 Mo-ZrO_(2)金属陶瓷 稳定剂 微观结构 电导率 孔隙率 Mo-ZrO_(2)cermet stabilizer microstructure electrical property porosity
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