防指纹膜对合成立方氧化锆宝石学性质检测的影响

Interference of anti-fingerprint film on testing of gemological properties of synthetic cubic zirconia

先采用反应磁控溅射工艺在无色的合成立方氧化锆(SCZ)表面沉积SiO_(2)底膜,再采用真空蒸镀法镀覆有机氟化物防指纹表面膜,检测对比了SCZ镀膜前后的宝石学性质。结果表明,在优化工艺条件下,SCZ镀膜后的水接触角可达110°以上,显示了优良的抗脏污性能。经颜色、折射率、热导率、紫外荧光、红外光谱、拉曼光谱等检测,除SCZ颜色受到轻微影响外,未发现镀膜对其他宝石学性质的检测结果有干扰作用。

A SiO_(2) underlayer was prepared on colorless synthetic cubic zirconia(SCZ)by reactive magnetron sputtering and then deposited with an organofluorine anti-fingerprint(AF)film by vacuum evaporation.The gemological properties of the SCZ before and after being deposited with the AF film were tested and compared.The results showed that the SCZ treated under the optimized conditions had a water contact angle larger than 110°,showing good anti-staining property.Except for its slight effect on the color of SCZ,the AF film had no interference in the testing of gemological properties of SCZ,such as refractive index,thermal conductivity,ultraviolet fluorescence,infrared spectrum,and Raman spectrum.