摘要
为解决ADC测试平台FPGA程序需兼容不同种类ADC及平台重构升级时间过长的问题,文章基于ARM+FPGA架构,提出基于Zlib解压缩算法的自动重构升级方法,很好的解决了在ADC芯片测试中更换待测AD芯片类型后需要重新下载FPGA比特流文件导致重构升级耗时较长问题。该升级系统无论是运行于ARM硬核的应用功能软件还是运行于可编程逻辑部分都具有较高计算性能的,使异构测试平台能更快更的高效的动态重构。
In order to solve the problem that the FPGA program in the ADC test platform needs to be compatible with different types of ADC, the platform reconstruction upgrade time is too long. The article is based on the ARM+FPGA architecture, proposes an automatic reconstruction upgrade method based on the zlib decompression algorithm. In the ADC chip test, changing the type of AD chip to be tested requires re-downloading the FPGA bitstream file, which leads to the problem of long time-consuming reconstruction and upgrade. The upgrade system has high computing performance whether it is running on the ARM hard core application software or the programmable logic part, so that the heterogeneous test platform can be dynamically reconfigured faster and more efficiently.
作者
倪文龙
钱宏文
刘继祥
NI Wen-long;QIAN Hong-wen;LIU Ji-xiang(China Electronics Technology Group Corporation No.58 Research Institute,Wuxi 214035 China)
出处
《自动化技术与应用》
2022年第9期55-57,共3页
Techniques of Automation and Applications