强电磁干扰下全电子引信通信孔的可靠性分析

Reliability analysis of communication hole of full electronic fuse under strong electromagnetic interference

为研究某型配备全电子安全系统的导弹在强电磁干扰下出现早炸,导致武器系统整体可靠度不高,通过在HFSS软件中建立了引信模型,仿真得出引信外壳上的通信孔的不同尺寸在150 kV、1~10 GHz强电磁脉冲干扰下引信内部的电场强度,结合全电子引信起爆电路计算附加在高压储能电容两端的干扰电压,以高压开关的自击穿电压为边界条件计算不同通信孔引信起爆模块的可靠度。首次以全电子安全系统的实际工况为背景,把握通信孔尺寸,结合电磁仿真软件,探究其对武器系统可靠性的影响,该方法可为计算其他参数对全电子引信可靠度提供借鉴,同时也为全电子引信的电磁兼容设计提供依据。

In order to study the problem of low reliability of a certain type of full electronic fuse under strong electromagnetic interference,a related model was established in the HFSS software.The electric field intensity inside the fuze under 150 kV and 1~10 GHz strong electromagnetic pulse interference with different sizes of communication holes on the fuze shell was obtained by simulation analysis,and based on this,combined with a certain type of all-electronic fuse initiation module circuit,we calculated the interference voltage attached to both ends of the high-voltage energy storage capacitor,taking the self-breakdown voltage of the high-voltage switch as the boundary.The conditions calculate the reliability of different communication hole fuse initiating modules under this interference.The method in this paper can be used for reference in calculating the influence of other parameters on the reliability of the full electronic fuse,and it also provides a basis for the electromagnetic compatibility design of the full electronic fuse.