面向高反光区域的自适应结构光

Adaptive Structured Light for High-Reflective Areas

在结构光三维成像中,待测场景的高反光区域会在相机成像阵列上出现饱和,这会影响相移法结构光的相位准确度。针对这一问题,提出一种自适应相移结构光测量方法。首先,投射若干幅均匀灰度图像,并检测高反光区域和饱和程度,逐像素点确定最优投影光强。然后,根据目标特性降低投影强度实现坐标映射,生成一组高动态范围的自适应调制条纹。最后,对于饱和程度较大的区域,结合坐标映射的相位进行相位融合。实验结果表明,相比于传统方法,所提方法能够更加准确地对投影光强进行调整,相位的最大均方根误差(RMSE)和饱和区域RMSE分别减小了99.43%和92.48%,有效地提高了高反光区域的形貌测量精度。

In three-dimensional imaging of structured light,the high-reflective areas of scenes to be measured will be saturated on camera imaging arrays,which affects the phase accuracy of phase-shift structured light.Therefore,an adaptive phase-shift structured light measurement method is proposed.First,several uniformly-grayscaled images are projected onto an object,the high-reflective areas and their saturation degrees are detected,and the optimal projected light intensity is determined pixel by pixel.Then,according to the object properties,the projected light intensity is reduced to realize coordinate mapping,and a group of adaptive fringes with a high dynamic range is automatically generated.Finally,the phases over the highly saturated area are fused with the phases of coordinate mapping.The experimental results reveal that the proposed method can accurately adjust the projected light intensity.Compared with the traditional method,the proposed method reduces the maximum root mean square error(RMSE)and the RMSE of the saturated areas by 99.43%and 92.48%,respectively,and it effectively improves the morphological measurement accuracy of the high-reflective areas.